AEC_Q100_Rev_G_Base_Document(8)

车用电子产品的执行标准。

AEC - Q100 - REV-G

May 14, 2007

Automotive Electronics Council

Component Technical Committee

2.3.3

Time Limit for Acceptance of Generic Data

There are no time limits for the acceptability of generic data as long as all reliability data taken since the initial qualification is submitted to the user for evaluation. This data must come from the specific part or a part in the same qualification family, as defined in Appendix 1. This data includes any customer specific data (if customer is non-AEC, withhold customer name), process change qualification, and periodic reliability monitor data (see Figure 1).

History

Process ChangeQualification

Process ChangeQualification

Customer #1SpecificQualification

Customer #2SpecificQualification

Present

Qualification data + Processchange qualification data +Reliability monitor data =acceptable generic data

Supplier InternalQualification

Internal DeviceCharacterization

Note:Some process changes (e.g., die shrink) will affect the use of

generic data such that data obtained before these types ofchanges will not be acceptable for use as generic data.

2.4

2.4.1

Test Samples Lot Requirements

Test samples shall consist of a representative device from the qualification family. Where multiple lot testing is required due to a lack of generic data, test samples as indicated in Table 2 must be composed of approximately equal numbers from non-consecutive wafer lots, assembled in non-consecutive molding lots. That is, they must be separated in the fab or assembly process line by at least one non-qualification lot.

2.4.2

Production Requirements

All qualification devices shall be produced on tooling and processes at the manufacturing site that will be used to support part deliveries at production volumes. Other electrical test sites may be used for electrical measurements after their electrical quality is validated.

Supplier Startof Production

Periodic ReliabilityMonitor Tests

Figure 1: Generic Data Time Line

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