AEC_Q100_Rev_G_Base_Document(14)

时间:2025-05-03

车用电子产品的执行标准。

TEST GROUP A – ACCELERATED ENVIRONMENT STRESS TESTS (CONTINUED)

# NOTES SAMPLE SIZE / LOT ADDITIONAL REQUIREMENTS NUMBER OF LOTS ACCEPT CRITERIA TEST METHOD

STRESS

ABV

Component Technical Committee

Temperature Cycling A4

0 Fails H, P, B, D, G

TC

JEDEC JESD22-A104 and Appendix 3

PC before TC for surface mount devices. Grade 0: -65ºC to +175ºC for 500 cycles, -50ºC to +175ºC for 1000 cycles, or -50ºC to +150ºC for 2000 cycles. Grade 1: -65oC to +150oC for 500 cycles or-50oC to +150oC for 1000 cycles. Grade 2: -50ºC to +150ºC for 500 cycles or-50ºC to +125ºC for 1000 cycles. Grade 3: -50ºC to +125ºC for 500 cycles or-50ºC to +105ºC for 1000 cycles. Grade 4: -10ºC to +105ºC for 500 cycles or-10ºC to + 90ºC for 1000 cycles. TEST before and after TC at hot temperature. on corner bonds (2 bonds per corner) and one mid-bond per side on each device. Preferred decap procedure to minimize damage and chance of false data is shown in Appendix 3.

Automotive Electronics Council

Table 2: Qualification Test Methods (continued)

Page 11 of 32

A5

0 FAILS H, P, B, D, G

Power Temperature Cycle 45 1

PTC

JESD22-A105

PC 22pcs before PTC for surface mount devices. Test required only on devices with maximum rated power = 1 watt or TJ = 40ºC or devices designed to drive inductive loads. Grade 0: Ta of -40ºC to +150ºC for 1000 cycles. Grade 1: Ta of -40ºC to +125ºC for 1000 cycles. Grades 2 to 4: Ta -40ºC to +105ºC for 1000 cycles. Thermal shut-down shall not occur during this test. TEST before and after PTC at room and hot temperature.

AEC - Q100 - REV-G

May 14, 2007

High Temperature Storage Life A6

H, P, B, D, G, K

HTSL 45 1

0 FAILS

A103

Plastic Packaged Parts Grade 0: +175ºC for 1000 hours or +150ºC for 2000 hours. Grade 1: +150ºC for 1000 hours or +175ºC for 500 hours. Grades 2 to 4: +125ºC for 1000 hours or +150ºC for 500 hours. Ceramic Packaged Parts +250ºC for 10 hours or +200ºC for 72 hours. TEST before and after HTSL at room and hot temperature. substituted for Test A6 (HTSL) if package and

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