AEC_Q100_Rev_G_Base_Document

车用电子产品的执行标准。

AEC - Q100 - Rev-G

May 14, 2007

STRESS TEST QUALIFICATION

FOR

INTEGRATED CIRCUITS

Automotive Electronics Council

Component Technical Committee

车用电子产品的执行标准。

AEC - Q100 - REV-G

May 14, 2007

Automotive Electronics Council

Component Technical Committee

TABLE OF CONTENTS

Appendix 1:

Appendix 2:

Appendix 3:

Appendix 4:

Appendix 5:

Definition of a Qualification Family

Q100 Certification of Design, Construction and Qualification Plastic Package Opening for Wire Bond Testing

Minimum Requirements for Qualification Plans and Results Part Design Criteria to Determine Need for EMC Testing

Attachments

AEC-Q100-001:

AEC-Q100-002:

AEC-Q100-003:

AEC-Q100-004:

AEC-Q100-005:

AEC-Q100-006:

AEC-Q100-007:

AEC-Q100-008:

AEC-Q100-009:

AEC-Q100-010:

AEC-Q100-011:

WIRE BOND SHEAR TEST

HUMAN BODY MODEL (HBM) ELECTROSTATIC DISCHARGE (ESD) TEST MACHINE MODEL (MM) ELECTROSTATIC DISCHARGE (ESD) TEST IC LATCH-UP TEST

NONVOLATILE MEMORY WRITE/ERASE ENDURANCE, DATA RETENTION, AND OPERATIONAL LIFE TEST

ELECTRO-THERMALLY INDUCED PARASITIC GATE LEAKAGE (GL) TEST FAULT SIMULATION AND TEST GRADING EARLY LIFE FAILURE RATE (ELFR) ELECTRICAL DISTRIBUTION ASSESSMENT SOLDER BALL SHEAR TEST

CHARGED DEVICE MODEL (CDM) ELECTROSTATIC DISCHARGE (ESD) TEST