AEC_Q100_Rev_G_Base_Document(15)

车用电子产品的执行标准。

TEST GROUP B – ACCELERATED LIFETIME SIMULATION TESTS

# NOTES SAMPLE SIZE / LOT ADDITIONAL REQUIREMENTS

For devices containing NVM, endurance preconditioning must be performed before HTOL per Q100-005.

Grade 0: +175ºC Ta for 408 hours or +150ºC Ta for 1000 hours.

Grade 1: +150oC Ta for 408 hours or +125oC Ta for 1000 hours.

NUMBER OF LOTS ACCEPT CRITERIA TEST METHOD

Component Technical Committee

STRESS

ABV

High Temperature Operating Life B1

0 FAILS H, P, B, D, G, K

HTOL

JEDEC JESD22-A108

Grade 2: +125ºC Ta for 408 hours or +105ºC Ta for 1000 hours.

Grade 3: +105ºC Ta for 408 hours or +85ºC Ta for 1000 hours.

Grade 4: +90ºC Ta for 408 hours or +70ºC Ta for 1000 hours.

Vcc (max) at which dc and ac parametrics are guaranteed. Thermal shut-down shall not occur during this test. TEST before and after HTOL at room, hot, and cold temperature.

Automotive Electronics Council

Table 2: Qualification Test Methods (continued)

Page 12 of 32

B2

H, P, B, N, G

Early Life Failure Rate ELFR 800 3

0 FAILS

AEC Q100-008

Devices that pass this stress can be used to populate other stress tests. Generic data is applicable. TEST before and after ELFR at room and hot temperature.

AEC - Q100 - REV-G

May 14, 2007

NVM Endurance, Data Retention, and Operational Life B3

H, P, B, D, G,

EDR 77 3

0 FAILS

AEC Q100-005

TEST before and after EDR at room and hot temperature.