AEC_Q100_Rev_G_Base_Document(18)

车用电子产品的执行标准。

TEST GROUP E – ELECTRICAL VERIFICATION TESTS (CONTINUED)

# NOTES SAMPLE SIZE / LOT ADDITIONAL REQUIREMENTS NUMBER OF LOTS ACCEPT CRITERIA TEST METHOD

STRESS

ABV

Latch-Up

0 Fails LU E4

H, P, B, D

6 1

AEC Q100-004

See attached procedure for details on how to perform the test. TEST before and after LU at room and hot temperature.

Electrical Distributions ED E5

H, P, B, D

30 3

See AEC AEC Q100-009

Supplier and user to mutually agree upon electrical parameters to be measured. TEST at room, hot, and cold temperature.

Fault Grading

--- FG E6 --- ---

4 of AEC AEC Q100-007

--- AEC Q003

For production testing, see section 4 of Q100-007 for test requirements.

Component Technical Committee

Characterization CHAR E7 --- --- ---

To be performed on new technologies and part families.

Electrothermally-Induced Gate Leakage

GL

0 Fails E8

D, P, B, S

6 1

AEC Q100-006

TEST before and after GL at room temperature within 96 hours of GL stress completion.

Automotive Electronics Council

Table 2: Qualification Test Methods (continued)

Page 15 of 32

E9

Electromagnetic Compatibility

EMC --- 1 1

SAE J1752/3 – Radiated Emissions

See Appendix 5 for guidelines on determining the applicability of this test to the device to be qualified. This test and its accept criteria is performed per agreement between user and supplier on a case-by-case basis.

D, G

0 Fails

Q100-012

Applicable to all smart power shall be performed per agreement case basis.

AEC - Q100 - REV-G

May 14, 2007

H, P, D,

JEDEC JESD89-1 Accelerated:

Applicable to devices with memory or accelerated) can be performed, in specifications. This test and its accept case basis. Final test report shall altitude data.