AEC_Q100_Rev_G_Base_Document(9)

车用电子产品的执行标准。

AEC - Q100 - REV-G

May 14, 2007

Automotive Electronics Council

Component Technical Committee

2.4.3

Reusability of Test Samples

Devices that have been used for nondestructive qualification tests may be used to populate other qualification tests. Devices that have been used for destructive qualification tests may not be used any further except for engineering analysis.

2.4.4

Sample Size Requirements

Sample sizes used for qualification testing and/or generic data submission must be consistent with the If the supplier elects to use generic data for qualification, the specific test conditions and results must be recorded and available to the user (preferably in the format shown in Appendix 4). Existing applicable generic data should first be used to satisfy these requirements and those of section 2.3 for each test requirement in Table 2. Device specific qualification testing should be performed if the generic data does not satisfy these requirements.

2.4.5

Pre- and Post-stress Test Requirements

End-point test temperatures (room, hot and/or cold) are specified in the "Additional Requirements" column of Table 2 for each test. The specific value of temperature must address the worst case operating temperature grade extremes on at least one lot of data (generic or device specific) submitted per test. For example, if a supplier designs a device intended solely for use in an operating temperature Grade 3 environment (e.g., -40°C to +85°C), the end-point test temperature extremes need only address those application limits. Qualification to applications in higher operating temperature grade environments (e.g., -40°C to +125°C for Grade 1) will require testing of at least one lot using these additional end-point test temperature extremes.

2.5

Definition of Test Failure After Stressing

Test failures are defined as those devices not meeting the individual device specification, criteria specific to the test, or the supplier's data sheet, in the order of significance as defined in section 2.2. Any device that shows external physical damage attributable to the environmental test is also considered a failed part of the data submission.

3. 3.1

QUALIFICATION AND REQUALIFICATION Qualification of a New Device

The stress test requirement flow for qualification of a new device is shown in Figure 2 with the corresponding test conditions defined in Table 2. For each qualification, the supplier must have data available for all of these tests, whether it is stress test results on the device to be qualified or acceptable generic data. A review shall also be made of other devices in the same generic family to ensure that there are no common failure mechanisms in that family. Justification for the use of generic data, whenever it is used, must be demonstrated by the supplier and approved by the user.

For each device qualification, the supplier must have available the following:

Certificate of Design, Construction and Qualification (see Appendix 2) Stress Test Qualification data (see Table 2 & Appendix 4)

Data indicating the level of fault grading of the software used for qualification (when applicable to the device type) per Q100-007 that will be made available to the customer upon request

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