AEC_Q100_Rev_G_Base_Document(7)

车用电子产品的执行标准。

AEC - Q100 - REV-G

May 14, 2007

Automotive Electronics Council

Component Technical Committee

Table 1: Part Qualification/Requalification Lot Requirements

Part Information

New device, no applicable generic data. A part in a family is qualified. The part to be qualified is less complex and meets the Family Qualification Definition per Appendix 1. A new part that has some applicable generic data.

Lot Requirements for Qualification

Lot and sample size requirements per Table 2. Only device specific tests as defined in section 4.2 are required. Lot and sample size

requirements per Table 2 for the required tests. Review Appendix 4 to determine required tests from Table 2. Lot and sample sizes per Table 2 for the required tests.

Review Table 3 to determine which tests from Table 2 are required. Lot and sample sizes per Table 2 for the required tests.

The electrical end-point testing on at least 1 lot (that completed qualification testing) must meet or exceed the temperature extremes for the device Grade required. Sample sizes shall be per Table 2.

Refer to Appendix 1, section 3. Refer to Appendix 1, section 3.

Part process change.

Part was environmentally tested to all the test extremes, but was electrically end-point tested at a temperature less than the Grade required. Qualification/Requalification involving multiple sites.

Qualification/Requalification involving multiple families.

With proper attention to these qualification family guidelines, information applicable to other devices in the family can be accumulated. This information can be used to demonstrate generic reliability of a device family and minimize the need for device-specific qualification test programs. This can be achieved through qualification and monitoring of the most complex (e.g., more memory, A/D, larger die size) device in the qualification family and applying this data to less complex devices that subsequently join this family. Sources of generic data should come from supplier-certified test labs, and can include internal supplier's qualifications, cell structure/standard circuit characterization and testing, user-specific qualifications, and supplier's in-process monitors. The generic data to be submitted must meet or exceed the test conditions specified in Table 2. End-point test temperatures must address the worst case temperature extremes for the device operating temperature grade being qualified on at least one lot of data. Failure to do so will result in the supplier testing 1 lot or, if there is no applicable or acceptable existing generic data, 3 lots for the stress test(s) in question on the device to be qualified. The user(s) will be the final authority on the acceptance of generic data in lieu of test data.

Table 3 defines a set of qualification tests that must be considered for any changes proposed for the component. The Table 3 matrix is the same for both new processes and requalification associated with a process change. This table is a superset of tests that the supplier and user should use as a baseline for discussion of tests that are required for the qualification in question. It is the supplier's responsibility to present rationale for why any of the recommended tests need not be performed.

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