GS8640V32T-250中文资料(14)
发布时间:2021-06-05
发布时间:2021-06-05
GS8640V18/32/36T-300/250/200/167
AC Test Conditions
Parameter
Input high levelInput low levelInput slew rateInput reference levelOutput reference level
Output load
Conditions
VDD – 0.2 V0.2 V1 V/nsVDD/2VDDQ/2Fig. 1
1.Include scope and jig capacitance.
2.Test conditions as specified with output loading as shown in Fig. 1
unless otherwise noted.
3.Device is deselected as defined by the Truth Table.
Output Load 1
DQ
50 VDDQ/2
* Distributed Test Jig Capacitance
30pF*
DC Electrical Characteristics
Parameter
Input Leakage Current(except mode pins)ZZ Input CurrentFT Input CurrentOutput Leakage CurrentOutput High VoltageOutput Low Voltage
Symbol
IILIIN1IIN2IOLVOH1VOL1
Test Conditions
VIN = 0 to VDDVDD ≥ VIN ≥ VIH0 V ≤ VIN ≤ VIHVDD ≥ VIN ≥ VIL0 V ≤ VIN ≤ VIL
Output Disable, VOUT = 0 to VDDIOH = –4 mA, VDDQ = 1.6 VIOL = 4 mA, VDD = 1.6 V
Min
–1 uA–1 uA–1 uA–100 uA–1 uA–1 uAVDDQ – 0.4 V
—
Max
1 uA1 uA100 uA1 uA1 uA1 uA—0.4 V
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