Fault Sensitivity Analysis and Reliability Enhancement of An(10)
时间:2025-03-10
时间:2025-03-10
Abstract — Reliability of systems used in space, avionic and biomedical applications is highly critical. Such systems consist of an analog front-end to collect data, an Analog-to-Digital Converter (ADC) to convert the collected data to digital form and a
9876
Delay (ns)
5432100
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4
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8
10
12
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16
(ARE)(ARE)TABLEIX
-ΣADC(NFTVSFT)
SENSITIVITY,
p=2,q=8,r=16
Resistance (in K)
Fig.28.r=32
Variationinperformancewithincreasingresistance(R),p=3,q=8,
(ARE)(ARE)TABLEVIII
DIGITALDECIMATIONFILTERSENSITIVITYOFTHENONFAULTTOLERANT(NFT)ANDTHEFAULTTOLERANT(FT)VERSIONS,p=2,
q=8,r=4
Fig.29. -Σmodulatorwithredundancy
tationandhencemaynotbeaneffectivereplacementfortheconventionalimplementation.
3)SuccessiveApproximationADC:Thesensitivityanaly-sisofthe4-bitSAADChasidenti edtheconvertlatchandtheoutputlatchascriticalblocks.TheTransientPulseToler-antLatch(TPTL)proposedin[24]wasconsideredforreliabil-ityimprovement.TheresistorsintheTPTL lteroutthetran-sientsarrivingattheinputofthelatchthushardeningitagainsttransients.Withincreasingvaluesoftheresistors,thelatchbe-comesmorefaulttolerantbutatthesametimeaperformancepenaltyisincurred[17](Figure27).Theoverheadcanbere-ducedbyreplacingonlythemostsensitivelatchinconvertlatchbyTPTL.
Figure28showsthatthedelayduetohigherresistancein-creasesexponentially.Therefore,the nalresistancevalueshouldbechosenbytakingtheperformancedegradationintoaccount.
4) -ΣADC:Sincethedigitaldecimation lterinthe -ΣADCuseslatchesextensively,usingtheTPTLdescribedintheprevioussubsectioncanlowerthesensitivityofthedecima-tion lter.Wetherefore,replacedalllatcheswithTPTLandobservedimprovementsinsensitivitiesofasmuchas21%(Ta-blesVIIIandIX).Thisimprovementisachievedhowever,atacostofreducedperformance.Figure28showstheperformancedegradationduetointroductionoftheresistance(R).B.AddingRedundancy
Whereastheprevioustechniquetendstowardsfaultre-silience,thistechniqueattemptstomasktheeffectofafault.Oneofthewaysfaulttolerancecanbeachievedthroughre-dundancyisto rstdetectthefaultandthenrecoverfromthefault.Thisinvolvesduplicationoftheblock,anddesignofan
(ARE)OF
(ARE)TABLEX
SENSITIVITY(×10 4)ANDMRE
-ΣMODULATOR,p=3,q=8,r=16
errordetectionschemewhichcanactivatetheredundantblockwhenafaultisdetected.Thistechniquehasbeenimplementedforthemodulatorinthe -ΣADC.The -Σmodulatorisanidealcandidateforapplyingthistechniquebecausethetech-niqueaddressestheintegratorwhichisauto-zeroedonthedec-imatedclock(T3inFigure29).Iftheerrorisnotcorrecteditwilleffectthesubsequentserialbitstreamgeneratedanditwillgenerateerroneousbitstillthenexttimetheintegratorisauto-zeroed.ThoughthistechniquecanbeusedforotherADCs,itwillhavethemaximumimpactonADCslikethe -Σ,partofwhichretainssomeinformationfromthepreviouscycle(liketheintegrator).
Whiletheinputisbeingsampledontothesamplingcapaci-tor,therestofthenodesintheADCaremaintainedatthevalueevaluatedinthepreviouscycle.Thischaracteristiccanbeusedtodetectanerrorandprotectthecircuitfromfaultsinjectedduringthesamplingtime.Sincerecent -ΣADCimplemen-tationsshowthatalmost50%[18]ofthecycletimeisspentinsampling,thisschemewouldaddressasizeablenumberoffaults.Thisfactfurtherforti estheargumentthattheproposedtechniqueisbettersuitedtothe -ΣADCascomparedtootherADCs.Figure29showsthemodi ed rst-order -Σmodula-torwiththeredundancyincorporatedinit.ThecapacitorC1
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