Secondary Electron Yield Measurements of TiN Coating and TiZ(2)
时间:2025-02-24
时间:2025-02-24
In the beam pipe of the positron Main Damping Ring (MDR) of the Next Linear Collider (NLC), ionization of residual gases and secondary electron emission give rise to an electron cloud which can cause the loss of the circulating beam. One path to avoid the
Figure1:SEYofbakedtechnicalsurfaces.350 Cfor24hr[10]2ExperimentDescription
ThesystemusedtomeasureSEYiscomposedoftwocoupledstainlesssteel(S/S)UHVchamberswherethepressureisinthelow10 10Torrscaleinthemeasurementchamberandhigh10 9Torrscaleinthe”loadlock”chamber,Fig.2.Samplesindividuallyscrewedtoacarrierplate,areloaded rstontoanaluminiumtransferplateintheloadlockchamber,evacuatedtoalow10 8Torrscale,andthentransferredtothemeasurementchamber.
Themeasurementchamberhastwoelectrongunsandasoft(1.49keV)x-raysource.Oneelectrongun(energy,1-20keV)isusedforAugerelectronspectroscopy(AES)lightelementsurfacecontaminationanalysis.Thex-raysourceisusedtoexcitephotoelectronsforsurfacechemicalvalenceanalysis,calledESCA(ElectronSpectroscopyforChemicalAnalysis).TiNstoichiometryismeasuredbyESCAtechniquewhichisalsocalledXPS(X-rayPhotoelectronSpectroscopy).
TheprincipleofXPSistocollectphotoelectronsejectedbyx-raysofknownenergynearthesurface(1-5nminformationdepth).TheemittedelectronshaveanenergyEkwhichisgivenbyequation1
Ek=hν Eb Φ(1)
wherehνistheenergyoftheincidentphoton,EbthebindingenergyoftheelectronrelativetotheFermilevelofthematerialandΦthespectrometerworkfunction.Thespectrumofthemeasuredkineticenergygivesthespectrumofthebindingenergyofthephotoelectrons.
Thex-raysourceisalsousedforexcitingsecondaryX-rayFluorescence(XRF)forthicknessmeasurementofthedepositedTiNoverlayers.Thesecondelectrongun(0-3keV)isusedmeasuretheSEY,andcanalsobeusedtoelectronconditionthesurface.
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