元器件交易网

HCF4052B

DCSPECIFICATIONS

TestCondition

Symbol

Parameter

VIS(V)

VEE(V)

VSS(V)

VDD(V)5101520510155101518

TA=25°CMin.

Typ.0.040.040.040.0847018012510105±0.1

Max.510201001050400280

Value

-40to85°C-55to125°CUnitMin.

Max.15030060030001200520360

Min.

Max.15030060030001200520360

IL

QuiescentDeviceCurrent(all

switchesONorallswitchesOFF)

µA

SWITCH

RONResistance

0VIVDD0VIVDD

00

ON

Resistance RON(betweenany2of4switches)ChannelLeakageCurrent(AllChannelOFF)(COMMONO/I)ChannelLeakageCurrent(AnyChannelOFF)InputCapacitanceOutput

CapacitanceFeedthrough

00

00

100

1000

1000

nA

OFF*

OFF*0018±0.110010001000nA

CICOCIO

5

-5

-5

5

180.2

VEE=VSSRL=1K toVSSIIS<2µA(onallOFFchannels)

510155101518

1.534

3.5711

±10-35

±0.17.5

3.5711

±11.534

3.5711

±11.534

pF

CONTROL(AddressorInhibit)

InputLowVoltageVIL

=VDD

thru1K

V

VIH

InputHighVoltage

VµApF

IIH,IILCI

InputLeakageCurrent

InputCapacitance

VI=0/18V

*Determinedbyminimumfeasibleleakagemeasurementforautomatingtesting.

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